International Journal of
Computer Sciences and Engineering

Scholarly Peer-Reviewed, and Fully Refereed Scientific Research Journal
Single Sampling Plan for Variable Indexed by AQL and AOQL with Known Coefficient of Variation
Single Sampling Plan for Variable Indexed by AQL and AOQL with Known Coefficient of Variation
J.R. Singh1 , A. Sanvalia2
1 School of Studies in Statistics, Vikram University, Ujjain, India.
2 School of Studies in Statistics, Vikram University, Ujjain, India.
Correspondence should be addressed to: arvindsanvalia@gmail.com.

Section:Research Paper, Product Type: Journal Paper
Volume-5 , Issue-10 , Page no. 20-25, Oct-2017

CrossRef-DOI:   https://doi.org/10.26438/ijcse/v5i10.2025

Online published on Oct 30, 2017

Copyright J.R. Singh, A. Sanvalia . This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
 
View this paper at   Google Scholar | DPI Digital Library
  XML View PDF Download  
Citation

IEEE Style Citation: J.R. Singh, A. Sanvalia, Single Sampling Plan for Variable Indexed by AQL and AOQL with Known Coefficient of Variation, International Journal of Computer Sciences and Engineering, Vol.5, Issue.10, pp.20-25, 2017.

MLA Style Citation: J.R. Singh, A. Sanvalia "Single Sampling Plan for Variable Indexed by AQL and AOQL with Known Coefficient of Variation." International Journal of Computer Sciences and Engineering 5.10 (2017): 20-25.

APA Style Citation: J.R. Singh, A. Sanvalia, (2017). Single Sampling Plan for Variable Indexed by AQL and AOQL with Known Coefficient of Variation. International Journal of Computer Sciences and Engineering, 5(10), 20-25.
Downloads (107)     Full view (105)
           
Abstract :
In this paper we have studies the effect of coefficient of variation (CV) on single sampling plan for variables indexed by acceptable quality level (AQL) and average outgoing quality limit (AOQL)based on the assumption of normality and independence are affected when the characteristic of an item possesses a normal distribution. Procedures and tables are given for the selection of single sampling plans for variables for given AQL and AOQL, whenever rejected lots are 100% inspected for replacement of nonconforming units. The operating characteristic (OC) function is described for different values of coefficient of variation. It is clear that the value of OC function with known CV shows higher values for the lot of bad quality. The values of n and k are also calculated with known coefficient of variation.
Key-Words / Index Term :
CV, sampling plan, AQL, AOQL, OC
References :
[1]. Brush, G. G., Hoadley, B., and Saperstein B., (1990), Estimating outgoing quality using the quality measurement plan, Technometrics, 32, 31-41.
[2]. Govindaraju, K., (1990), Single sampling plans for variables indexed by AQL and AOQL, Journal of Quality Technology, 22, 310-313.zzz\\
[3]. Govindaraju, K., and Soundararajan, V., (1986), Selection of single sampling plans for variables maching the Mil-Std 105 scheme, Journal of Quality Technology, 18, 234-238.
[4]. Hahn, G. J. (1986), Estimating the percent nonconforming in the accepted product after zero defect sampling. Journal of Quality Technology, 18, 182-188.
[5]. Martz, H. F., and Zimmer, W.J., (1990), A nonparametric Bayes empirical Bayes procedure for estimating the percent nonconforming in accepted lots, Journal of Quality Technology, 22, 95-104.
[6]. Sankle, R., and Singh, J.R., (2012a), Single Sampling Plans for Variables Indexed by AQL and AOQL with Measurement Error, Journal of Modern Applied Statistical Methods, 11, (2).
[7]. Sankle, R., and Singh, J.R., (2012b), Single Sampling Plans for Variables Indexed by AQL and AOQL with Measurement Error, Journal of Modern Applied Statistical Methods, 11, 396-406.
[8]. Soundararajan, V., (1981), Single sampling attributes inspection plans indexed by AQL and AOQL, Journal of Quality Technology, 13, 195-200.
[9]. Zaslavsky, A., (1988), Estimating nonconformity rates in C-defect sampling, Journal of Quality Technology, 20, 248-259.