Open Access   Article Go Back

Estimation of Software Reliability Using p – TEF Models

Suneet Saxena1 , Ajay Gupta2

Section:Research Paper, Product Type: Journal Paper
Volume-4 , Issue-7 , Page no. 129-132, Jul-2016

Online published on Jul 31, 2016

Copyright © Suneet Saxena, Ajay Gupta . This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

View this paper at   Google Scholar | DPI Digital Library

XML View
PDF Download

How to Cite this Paper

  • IEEE Citation
  • MLA Citation
  • APA Citation
  • BibTex Citation
  • RIS Citation

IEEE Style Citation: Suneet Saxena, Ajay Gupta, “Estimation of Software Reliability Using p – TEF Models,” International Journal of Computer Sciences and Engineering, Vol.4, Issue.7, pp.129-132, 2016.

MLA Style Citation: Suneet Saxena, Ajay Gupta "Estimation of Software Reliability Using p – TEF Models." International Journal of Computer Sciences and Engineering 4.7 (2016): 129-132.

APA Style Citation: Suneet Saxena, Ajay Gupta, (2016). Estimation of Software Reliability Using p – TEF Models. International Journal of Computer Sciences and Engineering, 4(7), 129-132.

BibTex Style Citation:
@article{Saxena_2016,
author = {Suneet Saxena, Ajay Gupta},
title = {Estimation of Software Reliability Using p – TEF Models},
journal = {International Journal of Computer Sciences and Engineering},
issue_date = {7 2016},
volume = {4},
Issue = {7},
month = {7},
year = {2016},
issn = {2347-2693},
pages = {129-132},
url = {https://www.ijcseonline.org/full_paper_view.php?paper_id=1014},
publisher = {IJCSE, Indore, INDIA},
}

RIS Style Citation:
TY - JOUR
UR - https://www.ijcseonline.org/full_paper_view.php?paper_id=1014
TI - Estimation of Software Reliability Using p – TEF Models
T2 - International Journal of Computer Sciences and Engineering
AU - Suneet Saxena, Ajay Gupta
PY - 2016
DA - 2016/07/31
PB - IJCSE, Indore, INDIA
SP - 129-132
IS - 7
VL - 4
SN - 2347-2693
ER -

VIEWS PDF XML
1511 1319 downloads 1364 downloads
  
  
           

Abstract

The paper present NHPP Software Reliability Growth model involving test effort function(TEF) and fault removal efficiency(TEF). TEF deals with the problem of limited time and resources available during software testing phase. FRE addresses the problem of multiple occurrences of fault before its final removal. In this paper we propose p-TEF models which incorporate both TEF and FRE. p is FRE which represent fraction of faults detected and corrected. If p is less than one, then debugging is imperfect whereas for p equals to one debugging is perfect. Existing TEF models compared with p-TEF models using statistical tools SSE , R2 and AIC. Results suggest that the p-TEF models fits and predict faults detection data better.

Key-Words / Index Term

Fault removal efficiency, Test Effort Function, NHPP Models, Akaike’s Information Criterion

References

[1] S. Yamada, H. Ohtera, and H. Narihisa, “Software Reliability Growth Models with Testing-effort”, IEEE Trans. Reliability,1986, R-35,1, pp 19–23.
[2] S. Yamada, J. Hishitani, and S. Osaki, “Software Reliability Growth Model with Weibull Testing Effort: A Model And Application”, IEEE Trans. Reliability,1993, 42, pp 100–105.
[3] P.K. Kapur, and S. Younes, “Modeling an Imperfect Debugging Phenomenon with Testing Effort”, In: Proceedings of 5th International Symposium on Software Reliability Engineering, 1994, pp 178-183.
[4] M. Shepperd, and C. Schofield, “Estimating Software Project Effort using Analogies”, IEEE Trans. Software Engineering,1997, 23, pp 736–743.
[5] C.Y. Huang, S.Y. Kuo, and I.Y. Chen, “Analysis of a Software Reliability Growth Model with Logistic Testing-Effort Function”, In Proceedings of 8th International Symposium on Software Reliability Engineering (ISSRE’1997),1997, pp 378–388.
[6] C.Y. Huang, J.H. Lo, S.Y. Kuo, and M.R. Lyu, “Software Reliability Modeling and Cost Estimation Incorporating Testing-Effort And Efficiency”, In Proceedings of 8th International Symposium on Software Reliability Engineering (ISSRE’1999), 1999, pp 62–72.
[7] C.Y. Huang, and S.Y. Kuo, “Analysis of Incorporating Logistic Testing-Effort Function into Software Reliability Modeling”, IEEE Transactions On Reliability,2002, 51, 3, pp 261-270.
[8] C.Y. Huang, “Performance Analysis Of Software Reliability Growth Models With Testing-Effort And Change Point”, Journal of Systems and Software, 2005 76, pp 181- 194.
[9] M. Kumar, N. Ahmad, and S.M.K. Quadri, S.M.K. “Software Reliability Growth Models and Data Analysis with a Pareto Test-Effort”, RAU Journal of Research, 2005, 15 (1-2), pp 124-128.
[10] N. Ahmad, M.U. Bokhari, S.M.K. Quadri, and M.G.M. Khan, “The Exponentiated Weibull Software Reliability Growth Model with Various Testing-Efforts and Optimal Release Policy: A Performance Analysis”, International Journal of Quality and Reliability Management, 2008, 25 (2), pp 211-235.
[11] N. Ahmad, M.G.M Khan, S.M.K Quadri, and M. Kumar, M. “Modeling And Analysis of Software Reliability With Burr Type X Testing-Effort and Release-Time Determination”, Journal of Modeling in Management, 2009, 4(1), pp 28-54.
[12] N. Ahmad, M.G.M Khan, and L.S. Rafi, “Analysis of an Inflection S-Shaped Software Reliability Model Considering Log-Logistic Testing-Effort and Imperfect Debugging”, International Journal of Computer Science and Network Security,2011, 11, 1, pp 161-171.
[13] A.G. Agarwal, P.K. Kapur, G. Kaur, and R. Kumar, “Genetic Algorithm Based Optimal Testing Effort Allocation Problem for Modular Software”, BIJIT-BVICAM’s International Journal of Information Technology, 2012, 4,1, pp 445-451.
[14] K.V.S Reddy and B. Raveendrababu, “Software Reliability Growth Model with Testing-Effort by Failure Free Software”, International Journal of Engineering and Innovative Technology, 2012, Vol 2, 6, pp 103-107.
[15] D.R. Jeske, X.M. Zhang and L. Pham “Accounting for Realities when Estimating the Field Failure Rate of Software”, In Proceedings of 8th International Symposium on Software Reliability Engineering (ISSRE’01), 2001 pp 332-339.
[16] X.M. Zhang, X.L. Teng and H. Pham, “Considering Fault Removal Efficiency in Software Reliability Assessment”, IEEE Trans. Systems, Man and Cybernetics-Part A: System and Humans, 2003, 33, 1, pp 114-120.
[17] B. Purnaiah, K.V. Rama and V.K.G. Bala, “Fault Removal
Efficiency in Software Reliability Growth Model”, Advances in Computational Research, 2012 4, 1, pp 74-77.
[18] Musa. “DACS software reliability dataset”, Data & Analysis Center for Software, J.D. 980. www.dacs.dtic.mil/databases/sled/swrel.shtml.