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Optimized Machine Learning Approach for Software Defect Prediction using K-means with Genetic Algorithms

Manjula C1 , Lilly Florence2

Section:Research Paper, Product Type: Journal Paper
Volume-6 , Issue-9 , Page no. 385-390, Sep-2018

CrossRef-DOI:   https://doi.org/10.26438/ijcse/v6i9.385390

Online published on Sep 30, 2018

Copyright © Manjula C, Lilly Florence . This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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IEEE Style Citation: Manjula C, Lilly Florence, “Optimized Machine Learning Approach for Software Defect Prediction using K-means with Genetic Algorithms,” International Journal of Computer Sciences and Engineering, Vol.6, Issue.9, pp.385-390, 2018.

MLA Style Citation: Manjula C, Lilly Florence "Optimized Machine Learning Approach for Software Defect Prediction using K-means with Genetic Algorithms." International Journal of Computer Sciences and Engineering 6.9 (2018): 385-390.

APA Style Citation: Manjula C, Lilly Florence, (2018). Optimized Machine Learning Approach for Software Defect Prediction using K-means with Genetic Algorithms. International Journal of Computer Sciences and Engineering, 6(9), 385-390.

BibTex Style Citation:
@article{C_2018,
author = {Manjula C, Lilly Florence},
title = {Optimized Machine Learning Approach for Software Defect Prediction using K-means with Genetic Algorithms},
journal = {International Journal of Computer Sciences and Engineering},
issue_date = {9 2018},
volume = {6},
Issue = {9},
month = {9},
year = {2018},
issn = {2347-2693},
pages = {385-390},
url = {https://www.ijcseonline.org/full_paper_view.php?paper_id=2878},
doi = {https://doi.org/10.26438/ijcse/v6i9.385390}
publisher = {IJCSE, Indore, INDIA},
}

RIS Style Citation:
TY - JOUR
DO = {https://doi.org/10.26438/ijcse/v6i9.385390}
UR - https://www.ijcseonline.org/full_paper_view.php?paper_id=2878
TI - Optimized Machine Learning Approach for Software Defect Prediction using K-means with Genetic Algorithms
T2 - International Journal of Computer Sciences and Engineering
AU - Manjula C, Lilly Florence
PY - 2018
DA - 2018/09/30
PB - IJCSE, Indore, INDIA
SP - 385-390
IS - 9
VL - 6
SN - 2347-2693
ER -

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Abstract

Software defect prediction is one of the most active research areas in software engineering. Machine learning approaches are good in solving these. A predictive model is constructed by using machine learning approaches and classified them into defective and non-defective modules. Clustering is an unsupervised classification method aims at creating groups of objects, or clusters, in such a way that objects in the same cluster are very similar and objects in different clusters are quite distinct. In this paper we proposed a new hybrid approach of K-means clustering algorithm combined with Genetic Algorithm to get the optimum no of clusters. From the present studies it is shown that the performance of the proposed optimized hybrid algorithm is better than the conventional k-means algorithm without optimization.

Key-Words / Index Term

Unsupervised classifier, Clustering, K-means, Genetic Algorithm, Software Defect Prediction

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