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Analysis of Reliability of A Two-Non-Identical Units Cold Standby Repairable System Has Two Types of Failure

Praveen Gupta1 , Pooja Vinodiya2

Section:Research Paper, Product Type: Journal Paper
Volume-6 , Issue-11 , Page no. 907-913, Nov-2018

CrossRef-DOI:   https://doi.org/10.26438/ijcse/v6i11.907913

Online published on Nov 30, 2018

Copyright © Praveen Gupta , Pooja Vinodiya . This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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IEEE Style Citation: Praveen Gupta , Pooja Vinodiya, “Analysis of Reliability of A Two-Non-Identical Units Cold Standby Repairable System Has Two Types of Failure,” International Journal of Computer Sciences and Engineering, Vol.6, Issue.11, pp.907-913, 2018.

MLA Style Citation: Praveen Gupta , Pooja Vinodiya "Analysis of Reliability of A Two-Non-Identical Units Cold Standby Repairable System Has Two Types of Failure." International Journal of Computer Sciences and Engineering 6.11 (2018): 907-913.

APA Style Citation: Praveen Gupta , Pooja Vinodiya, (2018). Analysis of Reliability of A Two-Non-Identical Units Cold Standby Repairable System Has Two Types of Failure. International Journal of Computer Sciences and Engineering, 6(11), 907-913.

BibTex Style Citation:
@article{Gupta_2018,
author = {Praveen Gupta , Pooja Vinodiya},
title = {Analysis of Reliability of A Two-Non-Identical Units Cold Standby Repairable System Has Two Types of Failure},
journal = {International Journal of Computer Sciences and Engineering},
issue_date = {11 2018},
volume = {6},
Issue = {11},
month = {11},
year = {2018},
issn = {2347-2693},
pages = {907-913},
url = {https://www.ijcseonline.org/full_paper_view.php?paper_id=3266},
doi = {https://doi.org/10.26438/ijcse/v6i11.907913}
publisher = {IJCSE, Indore, INDIA},
}

RIS Style Citation:
TY - JOUR
DO = {https://doi.org/10.26438/ijcse/v6i11.907913}
UR - https://www.ijcseonline.org/full_paper_view.php?paper_id=3266
TI - Analysis of Reliability of A Two-Non-Identical Units Cold Standby Repairable System Has Two Types of Failure
T2 - International Journal of Computer Sciences and Engineering
AU - Praveen Gupta , Pooja Vinodiya
PY - 2018
DA - 2018/11/30
PB - IJCSE, Indore, INDIA
SP - 907-913
IS - 11
VL - 6
SN - 2347-2693
ER -

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Abstract

This paper shows the analysis of reliability of a system composed of the two- N.I.U., NO and NS in which NO is operative and NS is kept in standby mode upon failure of operative units NO units NS become operative instantaneously. Unit-1 has two types of failures. Let failure time distribution of type 1 and type 2 are assumed to be exponential with parameters λ1 and λ2 respectively, and the repair time is taken as general. When the second unit is failed it goes for replacement.

Key-Words / Index Term

Reliability, MTSF, Availability, Busy period, Mean Sojourn Time

References

[1]. Agarwal, S.C., Mamta, S. and Shikha, B.; “Reliability characteristic of cold-standbyredundant system”. International Journal of Research and Reviews in Applied Sciences, 3(2), 193-199, (2010).
[2]. El-Damcese, M.A.; “Human error and common-cause failure modelling of a two-unit multiple system”. Journal of Theoretical and Applied Fracture Mechanics, 26, 117-127, (1997).
[3]. Goel, L.R., P. Srivastava and R. Gupta; Two unit cold standby system with correlated failures and repairs. International journal of system science, 23(3), 379-391, (1992).
[4]. Gupta, R. and G. Varshney; A two-identical unit parallel system with geometric failure and repair time distributions. Journal of Cobinatories, Information and System Science; Vol. 32, No.2, pp.127-136, (2007).
[5]. Wei, L., Attahiru, S.A. and Yiqiang, Q.Z.; “Stochastic analysis of a repairable system with three units and two repair facilities”. Journal of Microelectronics Reliability, 38(4), 585-595, (1998).