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Dielectric Properties of Sodium Silicate-An Investigation Report

Sudhangshu Chakraborty1 , Kousik Roy2 , Md. Ayub Sheikh3

Section:Research Paper, Product Type: Journal Paper
Volume-07 , Issue-18 , Page no. 132-134, May-2019

Online published on May 25, 2019

Copyright © Sudhangshu Chakraborty, Kousik Roy, Md. Ayub Sheikh . This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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IEEE Style Citation: Sudhangshu Chakraborty, Kousik Roy, Md. Ayub Sheikh, “Dielectric Properties of Sodium Silicate-An Investigation Report,” International Journal of Computer Sciences and Engineering, Vol.07, Issue.18, pp.132-134, 2019.

MLA Style Citation: Sudhangshu Chakraborty, Kousik Roy, Md. Ayub Sheikh "Dielectric Properties of Sodium Silicate-An Investigation Report." International Journal of Computer Sciences and Engineering 07.18 (2019): 132-134.

APA Style Citation: Sudhangshu Chakraborty, Kousik Roy, Md. Ayub Sheikh, (2019). Dielectric Properties of Sodium Silicate-An Investigation Report. International Journal of Computer Sciences and Engineering, 07(18), 132-134.

BibTex Style Citation:
@article{Chakraborty_2019,
author = { Sudhangshu Chakraborty, Kousik Roy, Md. Ayub Sheikh},
title = {Dielectric Properties of Sodium Silicate-An Investigation Report},
journal = {International Journal of Computer Sciences and Engineering},
issue_date = {5 2019},
volume = {07},
Issue = {18},
month = {5},
year = {2019},
issn = {2347-2693},
pages = {132-134},
url = {https://www.ijcseonline.org/full_spl_paper_view.php?paper_id=1347},
publisher = {IJCSE, Indore, INDIA},
}

RIS Style Citation:
TY - JOUR
UR - https://www.ijcseonline.org/full_spl_paper_view.php?paper_id=1347
TI - Dielectric Properties of Sodium Silicate-An Investigation Report
T2 - International Journal of Computer Sciences and Engineering
AU - Sudhangshu Chakraborty, Kousik Roy, Md. Ayub Sheikh
PY - 2019
DA - 2019/05/25
PB - IJCSE, Indore, INDIA
SP - 132-134
IS - 18
VL - 07
SN - 2347-2693
ER -

           

Abstract

The dielectric properties of sodium silicate (Na2SiO3) (SS) have been investigated in a wide range of frequency and temperatures. A strong dielectric dispersion is found to exist in low-frequency region. The frequency dependent dielectric properties of SS follow universal dynamic response. The measured dielectric data strongly depends on dielectric dispersion and controls the basic relaxation property. However, the parameters that control the dielectric properties such as coupling of ions are found to have frequency and temperature dependency.

Key-Words / Index Term

XRD, Dielectric loss, Dielectric constant (real & imaginary part)

References

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