Open Access   Article Go Back

Measuring the Diffusion Characteristic of Block Ciphers: The Bit Relationship Test (BRT)

Dipanjan Bhowmik1 , Avijit Datta2 , Sharad Sinha3

Section:Research Paper, Product Type: Conference Paper
Volume-03 , Issue-01 , Page no. 76-80, Feb-2015

Online published on Feb 18, 2015

Copyright © Dipanjan Bhowmik, Avijit Datta, Sharad Sinha . This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

View this paper at   Google Scholar | DPI Digital Library

XML View
PDF Download

How to Cite this Paper

  • IEEE Citation
  • MLA Citation
  • APA Citation
  • BibTex Citation
  • RIS Citation

IEEE Style Citation: Dipanjan Bhowmik, Avijit Datta, Sharad Sinha, “Measuring the Diffusion Characteristic of Block Ciphers: The Bit Relationship Test (BRT),” International Journal of Computer Sciences and Engineering, Vol.03, Issue.01, pp.76-80, 2015.

MLA Style Citation: Dipanjan Bhowmik, Avijit Datta, Sharad Sinha "Measuring the Diffusion Characteristic of Block Ciphers: The Bit Relationship Test (BRT)." International Journal of Computer Sciences and Engineering 03.01 (2015): 76-80.

APA Style Citation: Dipanjan Bhowmik, Avijit Datta, Sharad Sinha, (2015). Measuring the Diffusion Characteristic of Block Ciphers: The Bit Relationship Test (BRT). International Journal of Computer Sciences and Engineering, 03(01), 76-80.

BibTex Style Citation:
@article{Bhowmik_2015,
author = {Dipanjan Bhowmik, Avijit Datta, Sharad Sinha},
title = {Measuring the Diffusion Characteristic of Block Ciphers: The Bit Relationship Test (BRT)},
journal = {International Journal of Computer Sciences and Engineering},
issue_date = {2 2015},
volume = {03},
Issue = {01},
month = {2},
year = {2015},
issn = {2347-2693},
pages = {76-80},
url = {https://www.ijcseonline.org/full_spl_paper_view.php?paper_id=11},
publisher = {IJCSE, Indore, INDIA},
}

RIS Style Citation:
TY - JOUR
UR - https://www.ijcseonline.org/full_spl_paper_view.php?paper_id=11
TI - Measuring the Diffusion Characteristic of Block Ciphers: The Bit Relationship Test (BRT)
T2 - International Journal of Computer Sciences and Engineering
AU - Dipanjan Bhowmik, Avijit Datta, Sharad Sinha
PY - 2015
DA - 2015/02/18
PB - IJCSE, Indore, INDIA
SP - 76-80
IS - 01
VL - 03
SN - 2347-2693
ER -

           

Abstract

The paper describes a test aimed at measuring the diffusion characteristic of block ciphers. Cryptographic strength of a cipher is directly proportional to the extent to which diffusion is achieved by the underlying cipher, which is measured using the test described in the paper. The paper also enlists the results obtained from the test on various block ciphers. The test algorithm described in the paper will be subsequently added as part of the already existing varied test suite to act as a distinguisher based on the diffusion characteristic of the underlying cipher.

Key-Words / Index Term

Diffusion, Bit-by-bit Successful Matches, Block Cipher, Randomness

References

[1] Bhowmik, D., Datta, A., & Sinha, S.,2014," A Bit-level Block Cipher Diffusion Analysis Test – BLDAT", Proc. of the 3rd International Conference on Frontiers in Intelligent Computing Theory & Application (FICTA), AISC 327 Vol. 1 Springer ,667-674.
[2] Castro, J.C.H., Sieria, J.M., Seznec, A., Izquierdo, A., Ribagorda, A., 2005. "The Strict Avalanche Criterion Randomness Test", Mathematics and Computers in Simulation 02/2005, Elsevier Publication, 68(2005), 1-7.
[3] Deniz Toz, Ali Doğanaksoy, Meltem Sönmez Turun, "Statistical Analysis of Block Ciphers", Ulusal Kriptologi Sempozyumu, Ankara, Turkey (2005), 56-66.
[4] Katos,V, 2005. "A Randomness Test for Block Ciphers", Applied Mathematics and Computation, Elsevier Publication, 162(2005), 29-35.
[5] Paar, C. and Pelzl, J., 2010. "Understanding Cryptography", Berlin: Springer-Verleg.
[6] Soto J., L. Bassham, "Randomness Testing of the Advanced Encryption Standard Finalist Candidates", Computer Security Division, National Institute of Standards and Technology, 2000.